Study of the Variance in the Histogram Test of ADCs
نویسنده
چکیده
In this paper an overview of the uncertainty in the results obtained with the histogram test of Analog to Digital Converters is presented. The effect of phase noise, input equivalent additive noise and random phase difference on the number of counts of the cumulative histogram is shown. Theoretical and experimental results are presented.
منابع مشابه
Variance of the cumulative histogram of ADCs due to frequency errors
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